Lorena Anghel: search on Z-Library

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1

[IEEE 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Dresden, Germany (2018.3.19-2018.3.23)] 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE) - NBTI aged cell rejuvenation with back biasing and resulting critical path reordering for digital circuits in 28nm FDSOI

Sivadasan, Ajith, Shah, Riddhi Jitendrakumar, Huard, Vincent, Cacho, Florian, Anghel, Lorena

Year:

2018

Language:

english

File:

PDF, 406 KB

english, 2018

2

[IEEE 2010 12th Electronics Packaging Technology Conference - (EPTC 2010) - Singapore, Singapore (2010.12.8-2010.12.10)] 2010 12th Electronics Packaging Technology Conference - Reliability approach of high density Through Silicon Via (TSV)

Frank, Thomas, Chappaz, Cedrick, Leduc, Patrick, Arnaud, Lucile, Moreau, Stephane, Thuaire, Aurelie, El Farhane, Rebha, Anghel, Lorena

Year:

2010

Language:

english

File:

PDF, 1.50 MB

english, 2010

3

[IEEE 2008 IEEE International Symposium on Circuits and Systems - ISCAS 2008 - Seattle, WA, USA (2008.05.18-2008.05.21)] 2008 IEEE International Symposium on Circuits and Systems - Improving the scalability of checkpoint recovery for networks-on-chip

Rusu, Claudia, Grecu, Cristian, Anghel, Lorena

Year:

2008

Language:

english

File:

PDF, 164 KB

english, 2008

4

[IEEE 2016 IEEE 34th VLSI Test Symposium (VTS) - Las Vegas, NV, USA (2016.4.25-2016.4.27)] 2016 IEEE 34th VLSI Test Symposium (VTS) - Early system failure prediction by using aging in situ monitors: Methodology of implementation and application results

Anghel, Lorena, Benhassain, A., Sivadasan, A., Cacho, F., Huard, V.

Year:

2016

Language:

english

File:

PDF, 85 KB

english, 2016

5

Test and Reliability in Approximate Computing

Anghel, Lorena, Benabdenbi, Mounir, Bosio, Alberto, Traiola, Marcello, Vatajelu, Elena Ioana

Journal:

Journal of Electronic Testing

Year:

2018

Language:

english

File:

PDF, 1.09 MB

english, 2018

6

[IEEE 2019 IEEE Latin American Test Symposium (LATS) - Santiago, Chile (2019.3.11-2019.3.13)] 2019 IEEE Latin American Test Symposium (LATS) - Fault Mitigation of Switching Lattices under the Stuck-At-Fault Model

Anghel, Lorena, Bernasconi, Anna, Ciriani, Valentina, Frontini, Luca, Trucco, Gabriella, Vatajelu, Ioana

Year:

2019

Language:

english

File:

PDF, 316 KB

english, 2019

7

Circuit Design Steps for Nano-Crossbar Arrays: Area-Delay-Power Optimization with Fault Tolerance

Morgul, M. Ceylan, Frontini, Luca, Tunali, Onur, Anghel, Lorena, Ciriani, Valentina, Vatajelu, E. Ioana, Moritz, Csaba Andras, Stan, Mircea R., Alexandrescu, Dan, Altun, Mustafa

Journal:

IEEE Transactions on Nanotechnology

Year:

2020

File:

PDF, 3.17 MB

2020

8

Asymmetric transistor sizing targeting radiation-hardened circuits

Cristiano Lazzari, Gilson Wirth, Fernanda Lima Kastensmidt, Lorena Anghel, Ricardo Augusto da Luz Reis

Journal:

Electrical Engineering (Archiv fur Elektrotechnik)

Year:

2012

Language:

english

File:

PDF, 396 KB

english, 2012

9

Memory Defect Tolerance Architectures for Nanotechnologies

Michael Nicolaidis, Lorena Anghel, Nadir Achouri

Journal:

Journal of Electronic Testing

Year:

2005

Language:

english

File:

PDF, 1.23 MB

english, 2005

10

A Case Study on Phase-Locked Loop Automatic Layout Generation and Transient Fault Injection Analysis

Cristiano Lazzari, Ricardo A. L. Reis, Lorena Anghel

Journal:

Journal of Electronic Testing

Year:

2007

Language:

english

File:

PDF, 611 KB

english, 2007

11

CSL: Configurable Fault Tolerant Serial Links for Inter-die Communication in 3D Systems

Vladimir Pasca, Lorena Anghel, Michael Nicolaidis, Mounir Benabdenbi

Journal:

Journal of Electronic Testing

Year:

2012

Language:

english

File:

PDF, 716 KB

english, 2012

12

Simulating Single Event Transients in VDSM ICs for Ground Level Radiation

Dan Alexandrescu, Lorena Anghel, Michael Nicolaidis

Journal:

Journal of Electronic Testing

Year:

2004

Language:

english

File:

PDF, 254 KB

english, 2004

13

Adaptive inter-layer message routing in 3D networks-on-chip

Claudia Rusu, Lorena Anghel, Dimiter Avresky

Journal:

Microprocessors and Microsystems

Year:

2011

Language:

english

File:

PDF, 2.09 MB

english, 2011

14

[IEEE 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) - Tallinn, Estonia (2012.04.18-2012.04.20)] 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) - Efficient link-level error resilience in 3D NoCs

Pasca, Vladimir, Rehman, Saif-Ur, Anghel, Lorena, Benabdenbi, Mounir

Year:

2012

Language:

english

File:

PDF, 793 KB

english, 2012

15

[IEEE 2012 IEEE 62nd Electronic Components and Technology Conference (ECTC) - San Diego, CA, USA (2012.05.29-2012.06.1)] 2012 IEEE 62nd Electronic Components and Technology Conference - Electromigration behavior of 3D-IC TSV interconnects

Frank, Thomas, Moreau, Stephane, Chappaz, Cedrick, Arnaud, Lucile, Leduc, Patrick, Thuaire, Aurelie, Anghel, Lorena

Year:

2012

Language:

english

File:

PDF, 843 KB

english, 2012

16

[IEEE 2008 1st Microsystems and Nanoelectronics Research Conference (MNRC 2008) - Ottawa, ON, Canada (2008.10.15-2008.10.15)] 2008 1st Microsystems and Nanoelectronics Research Conference - A flexible network-on-chip simulator for early design space exploration

Grecu, Cristian, Ivanov, Andre, Saleh, Resve, Rusu, Claudia, Anghel, Lorena, Pande, Partha P., Nuca, Vasile

Year:

2008

Language:

english

File:

PDF, 268 KB

english, 2008

17

[IEEE 2012 IEEE 18th International On-Line Testing Symposium (IOLTS 2012) - Sitges, Spain (2012.06.27-2012.06.29)] 2012 IEEE 18th International On-Line Testing Symposium (IOLTS) - Through-silicon-via built-in self-repair for aggressive 3D integration

Nicolaidis, Michael, Pasca, Vladimir, Anghel, Lorena

Year:

2012

Language:

english

File:

PDF, 754 KB

english, 2012

18

[IEEE 13th IEEE International On-Line Testing Symposium (IOLTS 2007) - Crete, Greece (2007.07.8-2007.07.11)] 13th IEEE International On-Line Testing Symposium (IOLTS 2007) - Essential Fault-Tolerance Metrics for NoC Infrastructures

Grecu, Cristian, Anghel, Lorena, Pande, Partha P., Ivanov, Andre, Saleh, Resve

Year:

2007

Language:

english

File:

PDF, 264 KB

english, 2007

19

Kth-Aggressor Fault (KAF)-based Thru-Silicon-Via Interconnect Built-In Self-Test and Diagnosis

Vladimir Pasca, Lorena Anghel, Mounir Benabdenbi

Journal:

Journal of Electronic Testing

Year:

2012

Language:

english

File:

PDF, 3.39 MB

english, 2012

20

[IEEE 2011 16th IEEE European Test Symposium (ETS) - Trondheim, Norway (2011.05.23-2011.05.27)] 2011 Sixteenth IEEE European Test Symposium - I-BIRAS: Interconnect Built-In Self-Repair and Adaptive Serialization in 3D Integrated Systems

Nicolaidis, Michael, Pasca, Vladimir, Anghel, Lorena

Year:

2011

Language:

english

File:

PDF, 118 KB

english, 2011

21

[IEEE 2010 International Conference on Dependable Systems and Networks Workshops (DSN-W) - Chicago, IL, USA (2010.06.28-2010.07.1)] 2010 International Conference on Dependable Systems and Networks Workshops (DSN-W) - Fault tolerant communication in 3D integrated systems

Pasca, Vladimir, Anghel, Lorena, Benabdenbi, Mounir

Year:

2010

Language:

english

File:

PDF, 272 KB

english, 2010

22

[IEEE 2013 IEEE 19th International On-Line Testing Symposium (IOLTS) - Chania (2013.7.8-2013.7.10)] 2013 IEEE 19th International On-Line Testing Symposium (IOLTS) - Fault-tolerant adaptive routing under permanent and temporary failures for many-core systems-on-chip

Dimopoulos, Michael, Yi Gang,, Benabdenbi, Mounir, Anghel, Lorena, Zergainoh, Nacer-Eddine, Nicolaidis, Michael

Year:

2013

Language:

english

File:

PDF, 916 KB

english, 2013

23

[IEEE 2011 12th Latin American Test Workshop - LATW - Beach of Porto de Galinhas, Brazil (2011.03.27-2011.03.30)] 2011 12th Latin American Test Workshop (LATW) - Configurable Thru-Silicon-Via interconnect Built-In Self-Test and diagnosis

Pasca, Vladimir, Anghel, Lorena, Benabdenbi, Mounir

Year:

2011

Language:

english

File:

PDF, 740 KB

english, 2011

24

Fault-tolerant adaptive routing under an unconstrained set of node and link failures for many-core systems-on-chip

Dimopoulos, Michael, Gang, Yi, Anghel, Lorena, Benabdenbi, Mounir, Zergainoh, Nacer-Eddine, Nicolaidis, Michael

Journal:

Microprocessors and Microsystems

Year:

2014

Language:

english

File:

PDF, 3.18 MB

english, 2014

25

Editorial

Anghel, Lorena, Bolchini, Cristiana, Pontarelli, Salvatore

Journal:

Microprocessors and Microsystems

Year:

2014

Language:

english

File:

PDF, 183 KB

english, 2014

26

[IEEE 2011 16th IEEE European Test Symposium (ETS) - Trondheim, Norway (2011.05.23-2011.05.27)] 2011 Sixteenth IEEE European Test Symposium - Efficient Fault Detection Architecture Design of Latch-Based Low Power DSP/MCU Processor

Yu, Hai, Nicolaidis, Michael, Anghel, Lorena, Zergainoh, Nacer-Eddine

Year:

2011

File:

PDF, 316 KB

2011

27

[IEEE 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) - New York City, NY, USA (2013.10.2-2013.10.4)] 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) - BIST for logic and local interconnect resources in a novel mesh of cluster FPGA

Rehman, Saif-Ur, Benabdenbi, Mounir, Anghel, Lorena

Year:

2013

Language:

english

File:

PDF, 784 KB

english, 2013

28

[IEEE 2010 IEEE 16th International On-Line Testing Symposium (IOLTS 2010) - Corfu, Greece (2010.07.5-2010.07.7)] 2010 IEEE 16th International On-Line Testing Symposium - Configurable serial fault-tolerant link for communication in 3D integrated systems

Pasca, Vladimir, Anghel, Lorena, Rusu, Claudia, Benabdenbi, Mounir

Year:

2010

Language:

english

File:

PDF, 235 KB

english, 2010

29

[IEEE 2010 15th IEEE European Test Symposium (ETS) - Praha, Czech Republic (2010.05.24-2010.05.28)] 2010 15th IEEE European Test Symposium - Configurable fault-tolerant link for inter-die communication in 3D on-chip networks

Pasca, Vladimir, Anghel, Lorena, Rusu, Claudia, Benabdenbi, Mounir

Year:

2010

Language:

english

File:

PDF, 196 KB

english, 2010

30

[IEEE 2014 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) - Tampa, FL, USA (2014.7.9-2014.7.11)] 2014 IEEE Computer Society Annual Symposium on VLSI - Impact of Cluster Size on Routability, Testability and Robustness of a Cluster in a Mesh FPGA

Rehman, Saif Ur, Blanchardon, Adrien, Dhia, Arwa Ben, Benabdenbi, Mounir, Chotin-Avot, Roselyne, Naviner, Lirida, Anghel, Lorena, Mehrez, Habib, Amouri, Emna, Marrakchi, Zied

Year:

2014

Language:

english

File:

PDF, 385 KB

english, 2014

31

[IEEE 2010 IEEE 16th International On-Line Testing Symposium (IOLTS 2010) - Corfu, Greece (2010.07.5-2010.07.7)] 2010 IEEE 16th International On-Line Testing Symposium - Interconnect Built-In Self-Repair and Adaptive-Serialization (I-BIRAS) for 3D integrated systems

Nicolaidis, M., Pasca, Vladimir, Anghel, Lorena

Year:

2010

Language:

english

File:

PDF, 128 KB

english, 2010

32

[IEEE 2010 IEEE 16th International On-Line Testing Symposium (IOLTS 2010) - Corfu, Greece (2010.07.5-2010.07.7)] 2010 IEEE 16th International On-Line Testing Symposium - RILM: Reconfigurable inter-layer routing mechanism for 3D multi-layer networks-on-chip

Rusu, Claudia, Anghel, Lorena, Avresky, Dimiter

Year:

2010

Language:

english

File:

PDF, 301 KB

english, 2010

33

[IEEE 2011 IEEE 17th International On-Line Testing Symposium (IOLTS 2011) - Athens, Greece (2011.07.13-2011.07.15)] 2011 IEEE 17th International On-Line Testing Symposium - Memory BIST with address programmability

Fradi, Aymen, Nicolaidis, Michael, Anghel, Lorena

Year:

2011

Language:

english

File:

PDF, 207 KB

english, 2011

34

[IEEE 2014 IEEE 20th International On-Line Testing Symposium (IOLTS) - Platja d'Aro, Girona, Spain (2014.7.7-2014.7.9)] 2014 IEEE 20th International On-Line Testing Symposium (IOLTS) - Cost-efficient of a cluster in a mesh SRAM-based FPGA

Rehman, Saif Ur, Benabdenbi, Mounir, Anghel, Lorena

Year:

2014

File:

PDF, 396 KB

2014

35

[IEEE 2008 14th IEEE International On-Line Testing Symposium (IOLTS) - Rhodes, Greece (2008.07.7-2008.07.9)] 2008 14th IEEE International On-Line Testing Symposium - Communication Aware Recovery Configurations for Networks-on-Chip

Rusu, Claudia, Grecu, Cristian, Anghel, Lorena

Year:

2008

Language:

english

File:

PDF, 367 KB

english, 2008

36

[IEEE 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010) - Dresden (2010.03.8-2010.03.12)] 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010) - Error resilience of intra-die and inter-die communication with 3D spidergon STNoC

Pasca, Vladimir, Anghel, Lorena, Rusu, Claudia, Locatelli, Riccardo, Coppola, Marcello

Year:

2010

Language:

english

File:

PDF, 235 KB

english, 2010

37

[IEEE 2007 IFIP International Conference on Very Large Scale Integration - Atlanta, GA, USA (2007.10.15-2007.10.17)] 2007 IFIP International Conference on Very Large Scale Integration - Efficient timing closure with a transistor level design flow

Lazzari, Cristiano, Santos, Cristiano, Ziesemer, Adriel, Anghel, Lorena, Reist, Ricardo

Year:

2007

Language:

english

File:

PDF, 303 KB

english, 2007

38

[IEEE 4th IEEE International Symposium on Electronic Design, Test and Applications (delta 2008) - Hong Kong, China (2008.01.23-2008.01.25)] 4th IEEE International Symposium on Electronic Design, Test and Applications (delta 2008) - Coordinated versus Uncoordinated Checkpoint Recovery for Network-on-Chip Based Systems

Rusu, Claudia, Grecu, Cristian, Anghel, Lorena

Year:

2008

Language:

english

File:

PDF, 442 KB

english, 2008

39

[IEEE 2009 10th International Symposium on Quality of Electronic Design (ISQED) - San Jose, CA, USA (2009.03.16-2009.03.18)] 2009 10th International Symposium on Quality of Electronic Design - An effective approach to detect logic soft errors in digital circuits based on GRAAL

Yu, Hai, Nicolaidis, Michael, Anghel, Lorena

Year:

2009

Language:

english

File:

PDF, 187 KB

english, 2009

40

[IEEE 2014 10th Conference on Ph.D. Research in Microelectronics and Electronics (PRIME) - Grenoble, France (2014.6.30-2014.7.3)] 2014 10th Conference on Ph.D. Research in Microelectronics and Electronics (PRIME) - Test and diagnosis of FPGA cluster using partial reconfiguration

Rehman, Saif Ur, Benabdenbi, Mounir, Anghel, Lorena

Year:

2014

Language:

english

File:

PDF, 615 KB

english, 2014

41

Dependable Multicore Architectures at Nanoscale: The View From Europe

Ottavi, Marco, Pontarelli, Salvatore, Gizopoulos, Dimitris, Bolchini, Cristiana, Michael, Maria K., Anghel, Lorena, Tahoori, Mehdi, Paschalis, Antonis, Reviriego, Pedro, Bringmann, Oliver, Izosimov, V

Journal:

IEEE Design and Test

Year:

2015

Language:

english

File:

PDF, 362 KB

english, 2015

42

[ACM Press the conference - Paris, France (2000.03.27-2000.03.30)] Proceedings of the conference on Design, automation and test in Europe - DATE '00 - Cost reduction and evaluation of temporary faults detecting technique

Anghel, Lorena, Nicolaidis, Michael

Year:

2000

Language:

english

File:

PDF, 1014 KB

english, 2000

43

[IEEE 2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) - Napoli, Italy (2015.4.21-2015.4.23)] 2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) - Application-independent testing of multilevel interconnect in mesh-based FPGAs

Rehman, Saif Ur, Benabdenbi, Mounir, Anghel, Lorena

Year:

2015

Language:

english

File:

PDF, 278 KB

english, 2015

44

[IEEE 2014 32nd IEEE International Conference on Computer Design (ICCD) - Seoul, South Korea (2014.10.19-2014.10.22)] 2014 IEEE 32nd International Conference on Computer Design (ICCD) - Exploring the state dependent SET sensitivity of asynchronous logic - The muller-pipeline example

Steininger, Andreas, Veeravalli, Varadan S., Alexandrescu, Dan, Costenaro, Enrico, Anghel, Lorena

Year:

2014

Language:

english

File:

PDF, 1.23 MB

english, 2014

45

Non-volatile magnetic decoder based on magnetic tunnel junctions

Anghel, Lorena, Prenat, Guillaume, ZHAO, Weisheng, Deng, Erya

Journal:

Electronics Letters

Year:

2016

Language:

english

File:

PDF, 365 KB

english, 2016

46

[IEEE 2016 Euromicro Conference on Digital System Design (DSD) - Limassol, Cyprus (2016.8.31-2016.9.2)] 2016 Euromicro Conference on Digital System Design (DSD) - Synthesis and Performance Optimization of a Switching Nano-Crossbar Computer

Alexandrescu, Dan, Altun, Mustafa, Anghel, Lorena, Bernasconi, Anna, Ciriani, Valentina, Frontini, Luca, Tahoori, Mehdi

Year:

2016

Language:

english

File:

PDF, 517 KB

english, 2016

47

[IEEE 2016 IEEE European Test Symposium (ETS) - Amsterdam, Netherlands (2016.5.23-2016.5.27)] 2016 21th IEEE European Test Symposium (ETS) - A hybrid algorithm to conservatively check the robustness of circuits

Thole, Niels, Anghel, Lorena, Fey, Gorschwin

Year:

2016

Language:

english

File:

PDF, 176 KB

english, 2016

48

[IEEE 2017 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Lausanne, Switzerland (2017.3.27-2017.3.31)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017 - Workload dependent reliability timing analysis flow

Sivadasan, Ajith, Notin, Armelle, Huard, Vincent, Maurin, Etienne, Mhira, Souhir, Cacho, Florian, Anghel, Lorena

Year:

2017

Language:

english

File:

PDF, 168 KB

english, 2017

49

[IEEE 2017 International Mixed Signals Testing Workshop (IMSTW) - Thessaloniki, Greece (2017.7.3-2017.7.5)] 2017 International Mixed Signals Testing Workshop (IMSTW) - Test and reliability in approximate computing

Anghel, Lorena, Benabdenbi, Mounir, Bosio, Alberto, Vatajelu, Elena Ioana

Year:

2017

Language:

english

File:

PDF, 295 KB

english, 2017

50

Logic synthesis and testing techniques for switching nano-crossbar arrays

Alexandrescu, Dan, Altun, Mustafa, Anghel, Lorena, Bernasconi, Anna, Ciriani, Valentina, Frontini, Luca, Tahoori, Mehdi

Journal:

Microprocessors and Microsystems

Year:

2017

Language:

english

File:

PDF, 2.08 MB

english, 2017